A Low-Leakage Epitaxial High-κ Gate Oxide for Germanium Metal–Oxide–Semiconductor Devices
Hu, Chengqing, McDaniel, Martin D., Jiang, Aiting, Posadas, Agham, Demkov, Alexander A., Ekerdt, John G., Yu, Edward T.Volume:
8
Language:
english
Journal:
ACS Applied Materials & Interfaces
DOI:
10.1021/acsami.5b10661
Date:
March, 2016
File:
PDF, 1.91 MB
english, 2016