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[IEEE IECON 2015 - 41st Annual Conference of the IEEE Industrial Electronics Society - Yokohama (2015.11.9-2015.11.12)] IECON 2015 - 41st Annual Conference of the IEEE Industrial Electronics Society - A Colored Petri Nets model of the risk management process based on the ISO 14971 standard
Sobrinho, Alvaro, Neto, Jose, Cunha, Paulo, Dias da Silva, Leandro, Perkusich, AngeloYear:
2015
Language:
english
DOI:
10.1109/IECON.2015.7392145
File:
PDF, 945 KB
english, 2015