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[IEEE 2015 30th IEEE/ACM International Conference on Automated Software Engineering (ASE) - Lincoln, NE, USA (2015.11.9-2015.11.13)] 2015 30th IEEE/ACM International Conference on Automated Software Engineering (ASE) - CLAMI: Defect Prediction on Unlabeled Datasets (T)
Nam, Jaechang, Kim, SunghunYear:
2015
Language:
english
DOI:
10.1109/ase.2015.56
File:
PDF, 1.11 MB
english, 2015