[IEEE 2015 30th IEEE/ACM International Conference on Automated Software Engineering (ASE) - Lincoln, NE, USA (2015.11.9-2015.11.13)] 2015 30th IEEE/ACM International Conference on Automated Software Engineering (ASE) - TCA: An Efficient Two-Mode Meta-Heuristic Algorithm for Combinatorial Test Generation (T)
Lin, Jinkun, Luo, Chuan, Cai, Shaowei, Su, Kaile, Hao, Dan, Zhang, LuYear:
2015
Language:
english
DOI:
10.1109/ase.2015.61
File:
PDF, 237 KB
english, 2015