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[IEEE 2015 IEEE International Conference on Microwaves, Communications, Antennas and Electronic Systems (COMCAS) - Tel-Aviv, Israel (2015.11.2-2015.11.4)] 2015 IEEE International Conference on Microwaves, Communications, Antennas and Electronic Systems (COMCAS) - An oxide failure reliability model for shallow trench isolation based LDMOS devices
Kantarovsky, Johnatan Avraham, Shapira, ShyeYear:
2015
Language:
english
DOI:
10.1109/comcas.2015.7360374
File:
PDF, 575 KB
english, 2015