[IEEE Comput. Soc Design, Automation and Test in Europe - Paris, France (23-26 Feb. 1998)] Proceedings Design, Automation and Test in Europe - Hierarchical characterization of analog integrated CMOS circuits
Eckmuller, J., Gropl, M., Grab, H.Year:
1998
Language:
english
DOI:
10.1109/date.1998.655925
File:
PDF, 242 KB
english, 1998