[IEEE 63rd Device Research Conference Digest, 2005. DRC...

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[IEEE 63rd Device Research Conference Digest, 2005. DRC '05. - Santa Barbara, CA, USA (June 20-22, 2005)] 63rd Device Research Conference Digest, 2005. DRC '05. - Data retention behavior in the embedded SONOS nonvolatile memory cell

Chae, H.S., Jung, Y.S., Seo, S., Han, J.H., Hyun, J.W., Park, G.W., Um, M.Y., Kim, J.-H., Lee, B.J., Kim, KC., Cho, I.W., Bae, G.J., Lee, N.I., Kang, S.T., Kim, C.W.
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Volume:
1
Year:
2005
Language:
english
DOI:
10.1109/drc.2005.1553043
File:
PDF, 1.03 MB
english, 2005
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