[IEEE 2015 73rd Annual Device Research Conference (DRC) -...

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[IEEE 2015 73rd Annual Device Research Conference (DRC) - Columbus, OH, USA (2015.6.21-2015.6.24)] 2015 73rd Annual Device Research Conference (DRC) - Impact of SMT-induced edge dislocation positions to NFET performance

Shen, Tzer-Min, Wang, Shui-Jinn, Xiao, Zhi-Ren, Wu, Chung-Cheng, Wu, Jeff, Diaz, Carlos H.
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Year:
2015
Language:
english
DOI:
10.1109/drc.2015.7175621
File:
PDF, 998 KB
english, 2015
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