[IEEE 2015 37th Electrical Overstress/Electrostatic...

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[IEEE 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Reno, NV, USA (2015.9.27-2015.10.2)] 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Using CC-TLP to get a CDM robustness value

Esmark, Kai, Gaertner, Reinhold, Seidl, Stefan, zur Nieden, Friedrich, Wolf, Heinrich, Gieser, Horst
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Year:
2015
Language:
english
DOI:
10.1109/eosesd.2015.7314799
File:
PDF, 1.27 MB
english, 2015
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