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[IEEE 2015 ACM/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM) - Beijing, China (2015.10.22-2015.10.23)] 2015 ACM/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM) - Empirical Analysis of Change-Proneness in Methods Having Local Variables with Long Names and Comments
Aman, Hirohisa, Amasaki, Sousuke, Sasaki, Takashi, Kawahara, MinoruYear:
2015
Language:
english
DOI:
10.1109/esem.2015.7321197
File:
PDF, 11.68 MB
english, 2015