[IEEE 26th European Microwave Conference, 1996 - Prague, Czech Republic (1996.10.4-1996.10.6)] 26th European Microwave Conference, 1996 - Determining the reference impedance of on-wafer TLR calibrations on tossy substrates
Gillon, R., Raskin, J.-P., Vanhoenacker, D., Colinge, J.-P.Year:
1996
Language:
english
DOI:
10.1109/euma.1996.337545
File:
PDF, 4.02 MB
english, 1996