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[IEEE 2015 IEEE International Conference on Image Processing (ICIP) - Quebec City, QC, Canada (2015.9.27-2015.9.30)] 2015 IEEE International Conference on Image Processing (ICIP) - Per-patch metric learning for robust image matching
Karaoglu, Sezer, Everts, Ivo, van Gemert, Jan C., Gevers, TheoYear:
2015
Language:
english
DOI:
10.1109/icip.2015.7351525
File:
PDF, 914 KB
english, 2015