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[IEEE 1997 IEEE International Conference on Intelligent Processing Systems - Beijing, China (28-31 Oct. 1997)] 1997 IEEE International Conference on Intelligent Processing Systems (Cat. No.97TH8335) - Level-oriented GA-based test generation of logic circuits
Wangning Long,, Shiyuan Yang,, Yinghua Min,, Shibai Tong,Volume:
1
Year:
1997
Language:
english
DOI:
10.1109/icips.1997.672846
File:
PDF, 536 KB
english, 1997