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[IEEE 2015 International Conference on Optoelectronics and Microelectronics (ICOM) - Changchun, China (2015.7.16-2015.7.18)] 2015 International Conference on Optoelectronics and Microelectronics (ICOM) - An intense 87Rb cold atomic source for atom interferometry
Yingying, Li, Jijun, Xiong, Zhikun, JiangYear:
2015
Language:
english
DOI:
10.1109/icoom.2015.7398763
File:
PDF, 397 KB
english, 2015