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[IEEE 2015 IEEE SENSORS - Busan, South Korea (2015.11.1-2015.11.4)] 2015 IEEE SENSORS - Dynamical threshold setting method using outlier rejection test for sensor reaction detection
Hirasawa, Kazuki, Takahashi, Rika, Takei, Yoshinori, Nanto, Hidehito, Saitoh, AtsushiYear:
2015
Language:
english
DOI:
10.1109/icsens.2015.7370626
File:
PDF, 2.34 MB
english, 2015