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[IEEE 2014 IEEE 12th International Conference on Solid -State and Integrated Circuit Technology (ICSICT) - Guilin, China (2014.10.28-2014.10.31)] 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Novel method to determine base resistance in SiGe HBT HICUM based on rational function fitting
Sun, Yabin, Fu, Jun, Yang, Ji, Xu, Jun, Wang, Yudong, Zhou, Wei, Zhang, Wei, Cui, Jie, Liu, ZhihongYear:
2014
Language:
english
DOI:
10.1109/icsict.2014.7021629
File:
PDF, 802 KB
english, 2014