[IEEE 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Hsinchu (2015.6.29-2015.7.2)] 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits - A comparison study on the Al-based interfacial layers for Ge MIS devices
Yi-Gin Yang,, Bing-Yue Tsui,Year:
2015
DOI:
10.1109/ipfa.2015.7224400
File:
PDF, 1.36 MB
2015