[IEEE 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - Chicago, Il, USA (8-12 Aug. 2005)] 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - Modelling of EMC problems using TLM method
Piccolo, A., Galdi, V., Acone, M., Amendolara, A.Volume:
2
Year:
2005
Language:
english
DOI:
10.1109/isemc.2005.1513553
File:
PDF, 330 KB
english, 2005