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[IEEE 2015 IEEE International Symposium on Electromagnetic Compatibility - EMC 2015 - Dresden, Germany (2015.8.16-2015.8.22)] 2015 IEEE International Symposium on Electromagnetic Compatibility (EMC) - Coupling study in smart power mixed ICs with a dedicated on-chip sensor
Tomasevic, V., Boyer, A., Bendhia, S., Steinmair, A., Weiss, B., Seebacher, E., Rust, P.Year:
2015
Language:
english
DOI:
10.1109/isemc.2015.7256236
File:
PDF, 3.48 MB
english, 2015