[IEEE 2015 19th International Symposium on VLSI Design and Test (VDAT) - Ahmedabad, India (2015.6.26-2015.6.29)] 2015 19th International Symposium on VLSI Design and Test - Transient current estimation using S3C (Standard cell current transient characterization)
Skaggs, Michael, Rao, Sushmita K., Robucci, Ryan, Banerjee, Nilanjan, Patel, ChintanYear:
2015
Language:
english
DOI:
10.1109/isvdat.2015.7208110
File:
PDF, 498 KB
english, 2015