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[IEEE 1994 37th Midwest Symposium on Circuits and Systems - Lafayette, LA, USA (3-5 Aug. 1994)] Proceedings of 1994 37th Midwest Symposium on Circuits and Systems - Testability guided BIST technique
Yu Fang,, Albicki, A.Volume:
1
Year:
1994
Language:
english
DOI:
10.1109/mwscas.1994.519224
File:
PDF, 381 KB
english, 1994