[IEEE 2015 IEEE Radio Frequency Integrated Circuits Symposium (RFIC) - Phoenix, AZ, USA (2015.5.17-2015.5.19)] 2015 IEEE Radio Frequency Integrated Circuits Symposium (RFIC) - Behavioral modeling for fast characterization and design optimization of Doherty power amplifiers
Nabil, Abdellah, Fernez, Frederic, Ngoya, EdouardYear:
2015
Language:
english
DOI:
10.1109/rfic.2015.7337780
File:
PDF, 272 KB
english, 2015