[IEEE 1998 International Semiconductor Conference. CAS'98...

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[IEEE 1998 International Semiconductor Conference. CAS'98 Proceedings - Sinaia, Romania (6-10 Oct. 1998)] 1998 International Semiconductor Conference. CAS'98 Proceedings (Cat. No.98TH8351) - Test system for studies about devices' behaviour at low temperature

Iliescu, M., Culcer, M., Curuia, M., Cristescu, I.
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Volume:
1
Year:
1998
Language:
english
DOI:
10.1109/smicnd.1998.732371
File:
PDF, 348 KB
english, 1998
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