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[IEEE 2014 Silicon Nanoelectronics Workshop (SNW) - Honolulu, HI, USA (2014.6.8-2014.6.9)] 2014 Silicon Nanoelectronics Workshop (SNW) - Statistical analysis of minimum operation voltage (Vmin) in fully depleted silicon-on-thin-BOX (SOTB) SRAM cells
Mizutani, Tomoko, Yamamoto, Yoshiki, Makiyama, Hideki, Yamashita, Tomohiro, Oda, Hidekazu, Kamohara, Shiro, Sugii, Nobuyuki, Hiramoto, ToshiroYear:
2014
Language:
english
DOI:
10.1109/snw.2014.7348600
File:
PDF, 288 KB
english, 2014