A Low Power, Low Area Error Detecting Latch for Resilient Architectures in 28nm FDSOI
Tadros, Ramy N., Hua, Weizhe, Moreira, Matheus T., Calazans, Ney L. V., Beerel, Peter A.Year:
2016
Language:
english
Journal:
IEEE Transactions on Circuits and Systems II: Express Briefs
DOI:
10.1109/tcsii.2016.2536179
File:
PDF, 864 KB
english, 2016