Quasi-Single-Grain Pb(Zr,Ti)O 3 on Poly-Si TFT for Highly Reliable Nonvolatile Memory Device
Park, Jae Hyo, Joo, Seung KiVolume:
15
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2015.2455506
Date:
September, 2015
File:
PDF, 666 KB
english, 2015