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[IEEE 2014 IEEE International Test Conference (ITC) - Seattle, WA, USA (2014.10.20-2014.10.23)] 2014 International Test Conference - Improving test compression with scan feedforward techniques
Muthyala, Sreenivaas S., Touba, Nur A.Year:
2014
Language:
english
DOI:
10.1109/test.2014.7035358
File:
PDF, 2.45 MB
english, 2014