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[IEEE 2015 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2015.10.6-2015.10.8)] 2015 IEEE International Test Conference (ITC) - A comparative study of one-shot statistical calibration methods for analog / RF ICs

Lu, Yichuan, Subramani, Kiruba S., Huang, He, Kupp, Nathan, Huang, Ke, Makris, Yiorgos
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Year:
2015
Language:
english
DOI:
10.1109/test.2015.7342415
File:
PDF, 1.50 MB
english, 2015
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