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[IEEE IEEE Conference on Ultra Wideband Systems and Technologies, 2003 - Reston, Virginia, USA (Nov. 16-19, 2003)] IEEE Conference on Ultra Wideband Systems and Technologies, 2003 - Ultra-wideband object characterization via a-scan
Ossberger, G., Buchegger, T., Pourvoyeur, K., Schimback, E., Stelzer, A., Weigel, R.Year:
2003
Language:
english
DOI:
10.1109/uwbst.2003.1267888
File:
PDF, 332 KB
english, 2003