![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 29 April 2013)] Micro- and Nanotechnology Sensors, Systems, and Applications V - Radiation tolerance of silicon and diamond detectors exposed to MeV ion beams: characterization using IBIC technique
Jakšić, M., George, Thomas, Islam, M. Saif, Grilj, V., Skukan, N., Dutta, Achyut K., Pomorski, M., Kada, W., Kamiya, T.Volume:
8725
Year:
2013
Language:
english
DOI:
10.1117/12.2015435
File:
PDF, 1.29 MB
english, 2013