SPIE Proceedings [SPIE SPIE Optical Metrology 2013 -...

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SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Videometrics, Range Imaging, and Applications XII; and Automated Visual Inspection - Reduction of the lateral localization error of targets moving through a LIDAR beam

Remondino, Fabio, Wenzl, Konrad, Ruser, Heinrich, Shortis, Mark R., Beyerer, Jürgen, Kargel, Christian, Puente León, Fernando
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Volume:
8791
Year:
2013
Language:
english
DOI:
10.1117/12.2020528
File:
PDF, 980 KB
english, 2013
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