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SPIE Proceedings [SPIE SPIE Optical Metrology 2013 -...

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SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optical Measurement Systems for Industrial Inspection VIII - Automatic unit for measuring refractive index of air based on Ciddor equation and its verification using direct interferometric measurement method

Hucl, V., Lehmann, Peter H., Osten, Wolfgang, Čížek, M., Hrabina, J., Albertazzi, Armando, Mikel, B., Řeřucha, Š., Buchta, Z., Jedlička, P., Lešundák, A., Oulehla, J., Mrňa, L., Šarbort, M., Šmíd, R.,
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Volume:
8788
Year:
2013
Language:
english
DOI:
10.1117/12.2020756
File:
PDF, 1.30 MB
english, 2013
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