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SPIE Proceedings [SPIE Photonics Prague 2014 - Prague, Czech Republic (Wednesday 27 August 2014)] Photonics, Devices, and Systems VI - Characterization of porous surfaces with spatial point pattern analysis
Tománek, Pavel, Senderáková, Dagmar, Páta, Petr, Zou, Yibo, Kästner, Markus, Reithmeier, EduardVolume:
9450
Year:
2015
Language:
english
DOI:
10.1117/12.2070329
File:
PDF, 949 KB
english, 2015