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SPIE Proceedings [SPIE International Symposium on Optoelectronic Technology and Application 2014 - Beijing, China (Tuesday 13 May 2014)] International Symposium on Optoelectronic Technology and Application 2014: Image Processing and Pattern Recognition - Research on the multi-criteria combination in automatic recognition of marking points
Sharma, Gaurav, Zhou, Fugen, Liu, Jennifer, An, Yan, Dong, KeyanVolume:
9301
Year:
2014
Language:
english
DOI:
10.1117/12.2070685
File:
PDF, 1.18 MB
english, 2014