SPIE Proceedings [SPIE International Symposium on Optoelectronic Technology and Application 2014 - Beijing, China (Tuesday 13 May 2014)] International Symposium on Optoelectronic Technology and Application 2014: Image Processing and Pattern Recognition - The multi-spectral radiation influence research between buildings
Sharma, Gaurav, Zhou, Fugen, Liu, Jennifer, Li, Bo, Zhao, Huai-ci, Sun, Shi-jieVolume:
9301
Year:
2014
Language:
english
DOI:
10.1117/12.2072404
File:
PDF, 375 KB
english, 2014