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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 9 August 2015)] Polarization Science and Remote Sensing VII - The Polaris-M ray tracing program
Shaw, Joseph A., LeMaster, Daniel A., Chipman, Russell A., Lam, Wai Sze T.Volume:
9613
Year:
2015
Language:
english
DOI:
10.1117/12.2188928
File:
PDF, 2.02 MB
english, 2015