![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Seventh International Conference on Digital Image Processing (ICDIP15) - Los Angeles, United States (Thursday 9 April 2015)] Seventh International Conference on Digital Image Processing (ICDIP 2015) - Use of the self-organizing feature map to diagnose abnormal engineering change
Falco, Charles M., Jiang, Xudong, Lu, Ruei-Shan, Wu, Zhi-Ting, Peng, Kuo-Wei, Yu, Tai-YiVolume:
9631
Year:
2015
Language:
english
DOI:
10.1117/12.2197118
File:
PDF, 260 KB
english, 2015