SPIE Proceedings [SPIE Applied Optics and Photonics China (AOPC2015) - Beijing, China (Tuesday 5 May 2015)] AOPC 2015: Optical Test, Measurement, and Equipment - How to ensure the accuracy of the specification of UV-VIS-NIR spectrophotometers
Han, Sen, Ellis, Jonathan D., Guo, Junpeng, Guo, Yongcai, Ye, Junan, Lin, Fangsheng, Xia, Ming, Huang, Biyong, Yin, DejinVolume:
9677
Year:
2015
Language:
english
DOI:
10.1117/12.2199034
File:
PDF, 272 KB
english, 2015