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SPIE Proceedings [SPIE Applied Optics and Photonics China (AOPC2015) - Beijing, China (Tuesday 5 May 2015)] AOPC 2015: Image Processing and Analysis - High-orbit satellite reflection surface geometry information estimation using photometric measurement method
Shen, Chunhua, Yang, Weiping, Liu, Honghai, Zhang, ShixueVolume:
9675
Year:
2015
Language:
english
DOI:
10.1117/12.2199221
File:
PDF, 246 KB
english, 2015