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SPIE Proceedings [SPIE Sixth International Conference on Electronics and Information Engineering - Dalian, China (Saturday 26 September 2015)] Sixth International Conference on Electronics and Information Engineering - Image seam line method based on the combination of dijkstra algorithm and morphology
Zhang, Qiang, Kuang, Daizhi, Yan, Qiming, Nie, Yunju, Feng, Shengfeng, Li, JianchengVolume:
9794
Year:
2015
Language:
english
DOI:
10.1117/12.2203544
File:
PDF, 498 KB
english, 2015