SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, United States (Saturday 13 February 2016)] Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XX - Estimation of free carrier concentrations in high-quality heavily doped GaN:Si micro-rods by photoluminescence and Raman spectroscopy
Jeon, Heonsu, Tu, Li-Wei, Krames, Michael R., Strassburg, Martin, Mohajerani, M. S., Khachadorian, S., Nenstiel, C., Schimpke, T., Avramescu, A., Strassburg, M., Hoffmann, A., Waag, A.Volume:
9768
Year:
2016
Language:
english
DOI:
10.1117/12.2212890
File:
PDF, 1.11 MB
english, 2016