SPIE Proceedings [SPIE SPIE Defense and Security Symposium - Orlando, FL (Sunday 16 March 2008)] Polarization: Measurement, Analysis, and Remote Sensing VIII - Emission polarization from rough surfaces
An, Changhyuk, Chenault, David B., Goldstein, Dennis H., Zeringue, KyleVolume:
6972
Year:
2008
Language:
english
DOI:
10.1117/12.779755
File:
PDF, 304 KB
english, 2008