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SPIE Proceedings [SPIE SPIE Europe Security and Defence - Cardiff, Wales, United Kingdom (Monday 15 September 2008)] Electro-Optical and Infrared Systems: Technology and Applications V - Thermal infrared optical metrology using quadri-wave lateral shearing interferometry
Velghe, Sabrina, Huckridge, David A., Ebert, Reinhard R., Brahmi, Djamel, Boucher, William, Wattellier, Benoit, Guérineau, Nicolas, Haïdar, Riad, Primot, JérômeVolume:
7113
Year:
2008
Language:
english
DOI:
10.1117/12.800325
File:
PDF, 1.30 MB
english, 2008