SPIE Proceedings [SPIE Photonics Asia 2010 - Beijing, China (Monday 18 October 2010)] Optical Design and Testing IV - Study on testing resolution of optical system
Lu, Shaojun, Wang, Yongtian, Bentley, Julie, Zhang, Xiaolin, Guo, Rongli, Du, Chunlei, Tatsuno, Kimio, Wu, Jun, Han, Jun, Urbach, Hendrik P., Duan, CunliVolume:
7849
Year:
2010
Language:
english
DOI:
10.1117/12.871777
File:
PDF, 1.36 MB
english, 2010