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SPIE Proceedings [SPIE SPIE BiOS - San Francisco, California, USA (Saturday 22 January 2011)] Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVIII - Design and analysis of confocal-spectral microscopy using wavelength scanning scheme
Do, Dukho, Conchello, Jose-Angel, Cogswell, Carol J., Chun, Wanhee, Jeong, Hyeongjun, Wilson, Tony, Brown, Thomas G., Gweon, Dae-GabVolume:
7904
Year:
2011
Language:
english
DOI:
10.1117/12.873667
File:
PDF, 500 KB
english, 2011