SPIE Proceedings [SPIE SPIE BiOS - San Francisco, California, USA (Saturday 22 January 2011)] Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVIII - Wide-field reflection phase microscope
Yaqoob, Zahid, Conchello, Jose-Angel, Cogswell, Carol J., Yamauchi, Toyohiko, Fu, Dan, Wilson, Tony, Brown, Thomas G., Choi, Wonshik, Dasari, Ramachandra R., Feld, Michael S.Volume:
7904
Year:
2011
Language:
english
DOI:
10.1117/12.875877
File:
PDF, 914 KB
english, 2011