SPIE Proceedings [SPIE SPIE Astronomical Telescopes + Instrumentation - Amsterdam, Netherlands (Sunday 1 July 2012)] Ground-based and Airborne Instrumentation for Astronomy IV - An integrated 1-5 micron test bench for the characterization of cryogenic optical elements
Wehmeier, Udo J., McLean, Ian S., Ramsay, Suzanne K., Leisenring, Jarron, Durney, Olivier, Takami, Hideki, Solheid, Elliott, Luppino, Gerard A., Meyer, Michael R.Volume:
8446
Year:
2012
Language:
english
DOI:
10.1117/12.927066
File:
PDF, 884 KB
english, 2012