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1D inversion of DC resistivity data using a quality-based truncated SVD
Elonio A. Muiuane, Laust B. PedersenVolume:
49
Year:
2001
Language:
english
Pages:
8
DOI:
10.1046/j.1365-2478.2001.00264.x
File:
PDF, 384 KB
english, 2001