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Influence of the Annealing Process for the Metal Contacts of the SiC Semiconductor Radiation Detector
Mook Kang, Sang, Ho Ha, Jang, Hwan Park, Se, Soo Kim, Han, Hoon Lee, Dong, Kyun Kim, YongVolume:
45
Language:
english
Journal:
Journal of Nuclear Science and Technology
DOI:
10.1080/00223131.2008.10875875
Date:
June, 2008
File:
PDF, 698 KB
english, 2008