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[IEEE 2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings - Sinaia, Romania (10-14 Oct. 2000)] 2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings (Cat. No.00TH8486) - Excess noise modelling of SiGe BiCMOS devices
Ibarra, J., Vescovi, D., Bary, L., Borgarino, M., Kovacic, S., Lafontaine, H., Graffeuil, J., Plana, R.Volume:
1
Year:
2000
Language:
english
DOI:
10.1109/smicnd.2000.890245
File:
PDF, 361 KB
english, 2000